![](/img/cover-not-exists.png)
[IEEE 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) - Reykjavik, Iceland (2018.8.8-2018.8.10)] 2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO) - Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction
Viveros-Wacher, Andres, Rayas-Sanchez, E.JoseYear:
2018
Language:
english
DOI:
10.1109/NEMO.2018.8503117
File:
PDF, 743 KB
english, 2018