Investigation of Ti/CuO interface by X-ray photoelectron...

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Surface and Interface Analysis 2018 / 11

Investigation of Ti/CuO interface by X-ray photoelectron spectroscopy and atomic force microscopy

Chopra, Dev Raj, Pearson, Justin Seth, Durant, Darius, Bhakta, Ritesh, Chourasia, Anil R.
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Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.6576
Date:
November, 2018
File:
PDF, 2.26 MB
english, 2018
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