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Evaluation of statistical variability and parametric sensitivity of non-uniformly doped Junctionless FinFET
Kaundal, Shalu, Rana, Ashwani K.Volume:
91
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.10.017
Date:
December, 2018
File:
PDF, 2.62 MB
english, 2018