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[IEEE 2018 IEEE 34th International Conference on Data Engineering (ICDE) - Paris, France (2018.4.16-2018.4.19)] 2018 IEEE 34th International Conference on Data Engineering (ICDE) - Robust Discovery of Positive and Negative Rules in Knowledge Bases
Ortona, Stefano, Meduri, Venkata Vamsikrishna, Papotti, PaoloYear:
2018
Language:
english
DOI:
10.1109/ICDE.2018.00108
File:
PDF, 1.17 MB
english, 2018