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[IEEE 2018 19th International Conference on Electronic Packaging Technology (ICEPT) - Shanghai, China (2018.8.8-2018.8.11)] 2018 19th International Conference on Electronic Packaging Technology (ICEPT) - SiC MOSFET Threshold-Voltage Instability Under High Temperature Aging
Liu, Yang, Chen, Xianping, Zhao, ZhaoHui, Li, ZhiGang, Lu, CaiTao, Zhang, JingGuo, Ye, Huaiyu, Koh, Sau Wee, Wang, LiGen, Zhang, GuoqiYear:
2018
Language:
english
DOI:
10.1109/ICEPT.2018.8480781
File:
PDF, 6.77 MB
english, 2018