A Secure Integrity Checking System for Nanoelectronic...

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IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2018

A Secure Integrity Checking System for Nanoelectronic Resistive RAM

Majumder, Md Badruddoja, Hasan, Md Sakib, Uddin, Mesbah, Rose, Garrett S.
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2018.2876693
File:
PDF, 2.46 MB
english, 2018
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