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Ion backflow studies with a triple-GEM stack with increasing hole pitch
Luz, H. Natal da, Bhattacharya, P., Filho, L.A.S., França, L.E.F.M.Volume:
13
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/07/P07025
Date:
July, 2018
File:
PDF, 1.05 MB
english, 2018