Ascertaining the Nature and Distribution of Extended...

ECS Transactions 2018 / 07 Vol. 86; Iss. 7

Ascertaining the Nature and Distribution of Extended Crystalline Defects in Emerging Semiconductor Materials Using Electron Channeling Contrast Imaging

Schulze, Andreas, Han, Han, Strakos, Libor, Vystavel, Tomas, Porret, Clement, Loo, Roger, Caymax, Matty
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Volume:
86
Language:
english
Journal:
ECS Transactions
DOI:
10.1149/08607.0387ecst
Date:
July, 2018
File:
PDF, 859 KB
english, 2018
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