Analysis and Simulation of Functional Stress Degradation on...

Active and Passive Electronic Components 2002 Vol. 25; Iss. 3

Analysis and Simulation of Functional Stress Degradation on VDOMS Power Transistors

Zoaeter, M., Beydoun, B., Hajjar, M., Debs, M., Charles, J-P
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Volume:
25
Year:
2002
Language:
english
Journal:
Active and Passive Electronic Components
DOI:
10.1080/08827510213500
File:
PDF, 1.38 MB
english, 2002
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