A Sequential Bayesian Approach for Remaining Useful Life...

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IEEE Transactions on Reliability 2018

A Sequential Bayesian Approach for Remaining Useful Life Prediction of Dependent Competing Failure Processes

Fan, Mengfei, Zeng, Zhiguo, Zio, Enrico, Kang, Rui, Chen, Ying
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2018.2874459
File:
PDF, 4.66 MB
english, 2018
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