[IEEE 2018 IEEE International Conference on Electro/Information Technology (EIT) - Rochester, MI (2018.5.3-2018.5.5)] 2018 IEEE International Conference on Electro/Information Technology (EIT) - Modular Sparse Representation Based Classification Approach for Robust Face Recognition
Awedat, Khalfalla, Essa, Almabrok, Alajmi, MasoudYear:
2018
Language:
english
DOI:
10.1109/EIT.2018.8500164
File:
PDF, 2.04 MB
english, 2018