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[IEEE 2018 IEEE East-West Design & Test Symposium (EWDTS) - Kazan, Russia (2018.9.14-2018.9.17)] 2018 IEEE East-West Design & Test Symposium (EWDTS) - Impact of Resistive Open and Bridge Defects on the SET Robustness of Standard CMOS Combinational Logic
Andjelkovic, Marko, Stamenkovic, Zoran, Krstic, Milos, Kraemer, RolfYear:
2018
Language:
english
DOI:
10.1109/EWDTS.2018.8524748
File:
PDF, 355 KB
english, 2018