Potential-Based Modeling of Depletion-Mode MOSFET...

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IEEE Transactions on Electron Devices 2018

Potential-Based Modeling of Depletion-Mode MOSFET Applicable for Structural Variations

Iizuka, Takahiro, Umeda, Takuya, Hirano, Yoko, Kikuchihara, Hideyuki, Miura-Mattausch, Mitiko, Feldmann, Uwe, Navarro, Dondee, Molnar, Kund, Posch, Werner, Yonamine, Takashige, Kishigami, Hirofumi, Ha
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2867634
File:
PDF, 4.28 MB
english, 2018
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