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EXPRESS: Correlation of Trace Silicone Contamination Analyses on Epoxy Composites Using X-ray Photoelectron Spectroscopy (XPS) and Laser Induced Breakdown Spectroscopy (LIBS)
Ledesma, Rodolfo, Palmieri, Frank, Campbell, Brooke, Yost, William, Fitz-Gerald, James, Dillingham, Giles, Connell, JohnLanguage:
english
Journal:
Applied Spectroscopy
DOI:
10.1177/0003702818809928
Date:
October, 2018
File:
PDF, 745 KB
english, 2018