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[IEEE 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Paris, France (2018.7.8-2018.7.13)] 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) - Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

Mubarak, F., Mascolo, V., Rietveld, G., Spirito, M., Daffe, K., Haddadi, K.
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Year:
2018
Language:
english
DOI:
10.1109/CPEM.2018.8500810
File:
PDF, 461 KB
english, 2018
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