A Path to Energy Efficiency and Reliability for ICs: Fully...

IEEE Solid-State Circuits Magazine 2018 / 23 Vol. 10; Iss. 4

A Path to Energy Efficiency and Reliability for ICs: Fully Depleted Silicon-on-Insulator (FD-SOI) Devices Offer Many Advantages

Nguyen, Bich-Yen, Flatresse, Philippe, Schaeffer, Jamie, Arnaud, Franck, Mhira, Souhir, Huart, Vincent, Weber, Olivier, Sellier, Manuel, Maleville, Christophe
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Volume:
10
Language:
english
Journal:
IEEE Solid-State Circuits Magazine
DOI:
10.1109/MSSC.2018.2867405
Date:
November, 2018
File:
PDF, 4.94 MB
english, 2018
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