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Three-dimensional device simulation of random telegraph noise spectroscopy with Coulomb energy variation of the trap in high- k gate oxide
Lin, Po-Jui, Su, Chong-Zih, Yao, Chih-Wei, Watanabe, HiroshiVolume:
57
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.57.124301
Date:
December, 2018
File:
PDF, 916 KB
english, 2018