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[IEEE 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) - Torino, Italy (2018.9.4-2018.9.7)] 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) - Parameter Optimized Event Detection for NILM Using Frequency Invariant Transformation of Periodic Signals (FIT-PS)
Held, Pirmin, WeiBhaar, Daniel, Mauch, Steffen, Abdeslam, Djaffar Ould, Benyoucef, DirkYear:
2018
Language:
english
DOI:
10.1109/ETFA.2018.8502522
File:
PDF, 353 KB
english, 2018