[IEEE 2018 31st Symposium on Integrated Circuits and Systems Design (SBCCI) - Bento Gonçalves - RS, Brazil (2018.8.27-2018.8.31)] 2018 31st Symposium on Integrated Circuits and Systems Design (SBCCI) - 16NM 6T and 8T CMOS SRAM Cell Robustness Against Process Variability and Aging Effects

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