Total-ionizing-dose effects and proton-induced displacement...

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IEEE Transactions on Nuclear Science 2018

Total-ionizing-dose effects and proton-induced displacement damage on MoS2-interlayer-MoS2 tunneling junctions

Wang, Pan, Perini, Christopher J., O'Hara, Andrew, Gong, Huiqi, Wang, Pengfei, Zhang, En Xia, McCurdy, Michael W., Fleetwood, Daniel M., Schrimpf, Ronald D., Pantelides, Sokrates T., Vogel, Eric M.
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2879632
File:
PDF, 802 KB
english, 2018
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