Process Variation Aware Analysis of SRAM SEU Cross-Sections Using Data Retention Voltage
Kobayashi, Daisuke, Hayashi, Naoki, Hirose, Kazuyuki, Kakehashi, Yuya, Kawasaki, Osamu, Makino, Takahiro, Ohshima, Takeshi, Matsuura, Daisuke, Mori, Yoshiharu, Kusano, Masaki, Narita, Takanori, Ishii,Year:
2018
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2018.2882221
File:
PDF, 531 KB
english, 2018