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[IEEE 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV, USA (2018.9.23-2018.9.28)] 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - A Study of HBM and CDM Layout Simulations Tools
Abessolo-Bidzo, Dolphin, Derikx, Richard, Cappon, Paul, Zhao, ShuangYear:
2018
Language:
english
DOI:
10.23919/EOS/ESD.2018.8509764
File:
PDF, 2.70 MB
english, 2018