Exploring the Electro-Thermal Parameters of Reliable Power Modules: Insulated Gate Bipolar Transistor Junction and Case Temperature
Liu, Bo-Ying, Wang, Gao-Sheng, Tseng, Ming-Lang, Wu, Kuo-Jui, Li, Zhi-GangVolume:
11
Language:
english
Journal:
Energies
DOI:
10.3390/en11092371
Date:
September, 2018
File:
PDF, 4.51 MB
english, 2018