Modeling of interelectrode parasitic elements of V-groove SiC MOSFET
Zhou, Rui, Shintani, Michihiro, Hiromoto, Masayuki, Sato, TakashiVolume:
9
Year:
2018
Language:
english
Journal:
Nonlinear Theory and Its Applications, IEICE
DOI:
10.1587/nolta.9.344
File:
PDF, 3.03 MB
english, 2018