Correlation between composition, microstructure, and emission properties in Nd-doped Si-rich Si oxynitride films: investigation into the nature of the sensitizer
Liang, C-H, An, Y-T, Jin, W, Meng, D-C, Wang, D-P, Chen, C-A, Liu, K-Z, Kleyn, A W, Labbé, C, Cardin, J, Gourbilleau, FVolume:
30
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/1361-6528/aaea23
Date:
January, 2019
File:
PDF, 1.54 MB
english, 2019
File converter
More search results
More benefits 
