Gate Oxide Local Thinning Mechanism-Induced Sub-60...

  • Main
  • 2018
  • Gate Oxide Local Thinning Mechanism-Induced Sub-60...
IEEE Transactions on Electron Devices 2018

Gate Oxide Local Thinning Mechanism-Induced Sub-60 mV/Decade Subthreshold Swing on Charge-Coupled MIS(p) Tunnel Transistor

Yang, Chang-Feng, Chen, Bo-Jyun, Chen, Wei-Chen, Lin, Kuan-Wun, Hwu, Jenn-Gwo
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2879654
File:
PDF, 1.59 MB
english, 2018
Conversion to is in progress
Conversion to is failed