A metastability-immune error-resilient flip-flop for...

IEICE Electronics Express 2017 Vol. 14; Iss. 11

A metastability-immune error-resilient flip-flop for near-threshold variation-tolerant designs

Wang, Sheng, Chen, Chen, Xiang, Xiaoyan, Meng, Jianyi
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Volume:
14
Year:
2017
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.14.20170353
File:
PDF, 1.53 MB
english, 2017
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