[IEEE 48th European Solid-State Device Research Conference...

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[IEEE 48th European Solid-State Device Research Conference (ESSDERC 2018) - Dresden (2018.9.3-2018.9.6)] 2018 48th European Solid-State Device Research Conference (ESSDERC) - Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM

Maeda, Kazuki, Matsuda, Shinpei, Takeuchi, Ken, Yasuhara, Ryutaro
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Year:
2018
Language:
english
DOI:
10.1109/ESSDERC.2018.8486913
File:
PDF, 11.26 MB
english, 2018
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