[IEEE 48th European Solid-State Device Research Conference (ESSDERC 2018) - Dresden (2018.9.3-2018.9.6)] 2018 48th European Solid-State Device Research Conference (ESSDERC) - Observation and Analysis of Bit-by-Bit Cell Current Variation During Data-Retention of TaOx-based ReRAM
Maeda, Kazuki, Matsuda, Shinpei, Takeuchi, Ken, Yasuhara, RyutaroYear:
2018
Language:
english
DOI:
10.1109/ESSDERC.2018.8486913
File:
PDF, 11.26 MB
english, 2018