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[IEEE 2018 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2018.6.18-2018.6.22)] 2018 IEEE Symposium on VLSI Technology - Response Speed of Negative Capacitance FinFETs
Kwon, Daewoong, Liao, Yu-Hung, Lin, Yen-Kai, Duarte, Juan Pablo, Chatterjee, Korok, Tan, Ava J., Yadav, Ajay K., Hu, Chenming, Krivokapic, Zoran, Salahuddin, SayeefYear:
2018
Language:
english
DOI:
10.1109/VLSIT.2018.8510626
File:
PDF, 695 KB
english, 2018