[IEEE 2018 IEEE International Reliability Physics Symposium...

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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - A new mechanism of signal path charging damage across separated power domain deep N-Well interface

Chu, Yu-Lin, Kuo, Hsi-Yu, Hsu, Sheng-Fu, Tsai, Yung-Sheng, Wang, Ming-Yi, Chang, Chuan-Li, Kiang, Bill, Wu, Kenneth
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Year:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353631
File:
PDF, 1.10 MB
english, 2018
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