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Wide Bandgap Materials for Semiconductor Devices
Lee, Kuan-Wei, Liu, Chuan-Hsi, Misra, DurgaVolume:
91
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.10.010
Date:
December, 2018
File:
PDF, 239 KB
english, 2018