Evaluation of Switching Loss Contributed by Parasitic...

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Evaluation of Switching Loss Contributed by Parasitic Ringing for Fast Switching Wide Band-Gap Devices

Zhang, Zheyu, Guo, Ben, Wang, Fei
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2018.2883454
File:
PDF, 1.27 MB
english, 2018
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