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[IEEE 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Reno, NV (2018.9.23-2018.9.28)] 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - A Generic Formalism to Model ESD Snapback for Robust Circuit Simulation
Wang, Tianshi, McAndrew, Colin C.Year:
2018
Language:
english
DOI:
10.23919/eos/esd.2018.8509752
File:
PDF, 2.06 MB
english, 2018