From Process Corners to Statistical Circuit Design...

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IEEE Transactions on Electron Devices 2018

From Process Corners to Statistical Circuit Design Methodology: Opportunities and Challenges

Dongaonkar, Sourabh, Mudanai, Sivakumar P., Giles, Martin D.
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2860929
File:
PDF, 2.21 MB
english, 2018
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