[IEEE 2017 IEEE International Conference on Plasma Science (ICOPS) - Atlantic City, NJ, USA (2017.5.21-2017.5.25)] 2017 IEEE International Conference on Plasma Science (ICOPS) - Observation of Inorganic Layer Contamination by Impurities Originated From Organic Layers During Multilayer PEALD Process for Flexible Electronics Encapsulation
Lee, Jin Young, Kang, Woo Seok, Lee, Jae Ok, Song, Young-Hoon, Hur, MinYear:
2017
Language:
english
DOI:
10.1109/plasma.2017.8496303
File:
PDF, 166 KB
english, 2017