Statistical MOSFET Modeling Methodology for Cryogenic...

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IEEE Transactions on Electron Devices 2018

Statistical MOSFET Modeling Methodology for Cryogenic Conditions

Kabaoglu, Aykut, Solmaz, Nergiz Sahin, Ilik, Sadik, Uzun, Yasemin, Yelten, Mustafa Berke
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2877942
File:
PDF, 2.17 MB
english, 2018
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