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Reliability-based design optimization with confidence level under input model uncertainty due to limited test data
Yoojeong Noh, K. K. Choi, Ikjin Lee, David Gorsich, David LambVolume:
43
Language:
english
Pages:
16
DOI:
10.1007/s00158-011-0620-4
Date:
April, 2011
File:
PDF, 756 KB
english, 2011