Coulomb effect induced intrinsic degradation in OLED

Organic Electronics 2018 / 11

Coulomb effect induced intrinsic degradation in OLED

Peng, H., Yu, A.R., Liu, S.B., He, Y., Chen, X.Q., Hu, Y.M., Zeng, Q., Qin, J.J., Tang, Y.J., Xuxie, H.N., Zhong, G.Y., Hou, X.Y.
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Language:
english
Journal:
Organic Electronics
DOI:
10.1016/j.orgel.2018.11.042
Date:
November, 2018
File:
PDF, 941 KB
english, 2018
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