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A cost-driven reliability demonstration plan based on accelerated degradation tests
Kim, Seong-Joon, Mun, Byeong Min, Bae, Suk JooVolume:
183
Language:
english
Journal:
Reliability Engineering & System Safety
DOI:
10.1016/j.ress.2018.11.017
Date:
March, 2019
File:
PDF, 3.26 MB
english, 2019