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[IEEE 2018 IEEE Photonics Conference (IPC) - Reston, VA, USA (2018.9.30-2018.10.4)] 2018 IEEE Photonics Conference (IPC) - Silicon Nitride Echelle Grating Spectrometer for Operation Near 1.55μm
Xie, Shengjie, Meng, Yang, Hawthorn, Joss Bland, Veilleux, Sylvain, Dagenais, MarioYear:
2018
Language:
english
DOI:
10.1109/ipcon.2018.8527273
File:
PDF, 697 KB
english, 2018