[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Novel Techniques of FIB Edit on VDD Routing in Internal Circuit for IDDQ Leakage Failure Analysis
Nazakat, Akeel, Yungui, Li, Liu, Renee, Chew, VincentYear:
2018
Language:
english
DOI:
10.1109/IPFA.2018.8452512
File:
PDF, 2.00 MB
english, 2018