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Structural characterization determination of silicon nanocrystals embedded in amorphous silicon nitride matrix from the effect of the light scattering
Hafsi, Nadjet, Bouridah, Hachemi, Boutaoui, Noureddine, Haoues, HakimLanguage:
english
Journal:
Optik
DOI:
10.1016/j.ijleo.2018.11.141
Date:
November, 2018
File:
PDF, 980 KB
english, 2018