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[IEEE 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER) - Honolulu, HI, USA (2017.7.31-2017.8.4)] 2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems (CYBER) - System Calibration Towards Automated Nanomanipulation Inside Scanning Electron Microscope
Wang, Mingyu, Wang, Yaqiong, Yang, Zhan, Chen, Tao, Sun, Lining, Fukuda, ToshioYear:
2017
Language:
english
DOI:
10.1109/CYBER.2017.8446339
File:
PDF, 860 KB
english, 2017