Slice overlap-detection algorithm for process planning in multiple-material stereolithography
Ho-Chan Kim, Jae-Won Choi, Eric MacDonald, Ryan WickerVolume:
46
Language:
english
Pages:
10
DOI:
10.1007/s00170-009-2181-x
Date:
February, 2010
File:
PDF, 459 KB
english, 2010