Variation risk analysis: MEMS fabrication tolerance for a...

Variation risk analysis: MEMS fabrication tolerance for a micro CMM probe

Yunfei Sun, Clifford R. Fowkes, Nabil Gindy, Richard K. Leach
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Volume:
47
Language:
english
Pages:
8
DOI:
10.1007/s00170-009-2251-0
Date:
April, 2010
File:
PDF, 217 KB
english, 2010
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