Development process and analytical method of the pole-to-pole DC fault in the MMC-MVDC system
Li, Bo-Tong, Liu, Yi-Chao, Li, Bin, Zhang, Yun-Ke, Jia, Jian-Fei, Jing, Fang-JieLanguage:
english
Journal:
IET Power Electronics
DOI:
10.1049/iet-pel.2017.0314
Date:
September, 2017
File:
PDF, 2.94 MB
english, 2017