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Comparative study of the accuracy of characterization of thin films a-Si on glass substrates from their interference normal incidence transmittance spectrum by the Tauc-Lorentz-Urbach, the Cody-Lorentz-Urbach, the optimized envelopes and the optimized graphical methods
Minkov, Dorian, Angelov, George, Nestorov, Radi, Marquez, Emilio Jose, Blanco, Eduardo, Ruiz-Perez, JuanLanguage:
english
Journal:
Materials Research Express
DOI:
10.1088/2053-1591/aaf546
Date:
November, 2018
File:
PDF, 1.03 MB
english, 2018