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A comprehensive methodology for runout tolerance evaluation using discrete data
Hemant Ramaswami, Steven Turek, Siddharth Rajmohan, Sam AnandVolume:
56
Language:
english
Pages:
14
DOI:
10.1007/s00170-011-3218-5
Date:
September, 2011
File:
PDF, 765 KB
english, 2011