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[IEEE 2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA (2018.10.14-2018.10.17)] 2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Statistical Approach to Analyze Duty Cycle Jitter Amplification in NAND Flash Memory System
Mobin, Sayed, Cui, Cindy, Rao, FangyiYear:
2018
Language:
english
DOI:
10.1109/EPEPS.2018.8534229
File:
PDF, 925 KB
english, 2018