[IEEE 2018 15th International Conference on Electrical...

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[IEEE 2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) - Mexico City (2018.9.5-2018.9.7)] 2018 15th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) - Indentation Image Analysis for Vickers Hardness Testing

Dominguez-Nicolas, Saul M., Wiederhold, Petra
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Year:
2018
Language:
english
DOI:
10.1109/ICEEE.2018.8533881
File:
PDF, 1.81 MB
english, 2018
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